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Test Universe 4.30 – More Flexibility with Sampled Values

Electrical Engineering

09/08/2021

Tags: News, cybersecurity

Support for latest functions from IEC 61869-9 and IEC 61850-9-2 Ed2.1 

The new version 4.30 of Test Universe, OMICRON's solution for advanced settings-based protection testing, expands the possibilities when testing with Sampled Values (SV). Configurable datasets with up to 32 values are now supported. The output of the Optional Fields offers new settings and the scope has been adapted to the latest developments in the IEC standard. The generation of up to three SV streams is now also possible with the CMC 430. 

Extended functionality of the client/server module 

For tests that require a large number of binary outputs or even the use of several ISIO 200 devices, the virtual binary outputs are now also supported. Furthermore, control operations can be performed for excitation of the devices under test. In addition, the reuse of tests has been improved, device names can now be renamed easily. 

New start page and other improvements 

The revised design of the start page simplifies access to both the OMICRON Control Center (OCC) and the Protection Testing Library (PTL) for performing automated tests as well as to the most frequently used test modules. Two new states have been added to the automated evaluation of test results in the OCC for clearer visualization. In addition to improvements based on customer feedback, the usability and testing procedure of the PQ test templates have been optimized. 

Available from September 2021. 

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